- Title
- Application of low energy ion scattering to alloy surfaces and surface alloys
- Creator
- O'Connor, D. J.
- Relation
- Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems p. 1-16
- Relation
- https://www.novapublishers.com/catalog/product_info.php?products_id=1383
- Publisher
- Nova Science Publishers
- Resource Type
- book chapter
- Date
- 2003
- Description
- The use of low energy ion scattering (LEIS) to selectively arnlyze the outermost layers of the surface of materials is a well-established and vaiuable tool. The technique involves the use of 100 eV to 10 keV ions and atoms elastically scattered off the surface of materials. The energy and yield of the scattered particles reveals the composition and structure of the surface. The history of this technique is a little over 30 years old and is well - summarized in recent reviews. As there are already numerous descriptions of the application of LEIS to surface analysis, this work will concentrate on its application to structure with a particular emphasis on alloys and "surface alloys". The surface selectivity can be varied by the appropriate choice of energy and prqectile. Typically low energy inert gas ions will provide information about the outermost atomrc layer as all penetrating projectiles will be neutralized and hence escape detection when using electrostatic or magnetic analyzes. The use of alkali ions, time-of-flight (TOF) techniques and higher energy inert gas ions allows the measurement of structure and composition at deeper layers in the material as either ions scattered deeper in the surface remain ionised or the detection technique is equally capable of detecting ions and neutrals.
- Subject
- low energy ion scattering; surface alloys; alkali ions; time-of-flight techniques; higher energy inert gas ions
- Identifier
- http://hdl.handle.net/1959.13/35236
- Identifier
- uon:3829
- Identifier
- ISBN:1590335384
- Language
- eng
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